15.30 - 16.30 Innovative Sample Preparation Technology to Reduce Bottleneck in a measurement processes
14.45 - 15.30 Total Element Analysis (ICP-MS)
9.10 - 10.00 New Technology of GC-MS and Applications
15.30 - 16.30 Innovative Sample Preparation Technology to Reduce Bottleneck in a measurement processes
14.45 - 15.30 Total Element Analysis (ICP-MS)
9.10 - 10.00 New Technology of GC-MS and Applications